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  Scanning electron microscope £®Nova NanoSEM 430£©  

Producer:FEI

Date of installation:2008.07.20

Specifications:
Resolution:
2.0 nm @ 1kv
1.0 nm @ 15kv

Magnification
35x-900kx

Voltage
0.2 kV-30kV

Main Functions:
Morphology characterization

Element analysis

Nanofrabrication


Manager:Li Feng

Location:
158


 
Copyright©Advanced Carbons Division Shenyang National Laboratory for Materials Science.
Address:72 Wenhua Road Shenyang, China 110016 Tel:86-24-23971788 83978238 Fax:86-24-23971215 Email:fli@imr.ac.cn